Atomic Force Microscopy; AFM; Park Systems NX10
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Manager : Functional Energy Transfer Nano System Lab
Instrument : AFM
Location : Science Building 560
Usage : Measurement of sample's morphology and roughness
- could measure up to nano scale
- could measure without damage
- Fluid Film Damping : 10 um
- Electrostatic Forces : 0.1-1.0 um
- Fluid Surface Tension Forces : 10-200 nm
- Van Der Waals Force : Angstrom
- Coulombic Forces : ~0.1 Angstrom